An Enhancing Reliability Method for Multilevel Flash Memory by Using Interleaving Arrangement

碩士 === 國立中興大學 === 資訊科學與工程學系所 === 99 === In this work, we propose a new interleaving arrangement to average the temporary error bits caused by dichotomic serial sensing architecture in multilevel flash. Furthermore, the proposed arrangement also can effectively enhance the reliability (MTBF) of multi...

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Bibliographic Details
Main Authors: Tzung-Han Yeh, 葉宗翰
Other Authors: Der-Chen Huang
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/44622038307594636418