Develop reflective spectrometer for thin film measurement
碩士 === 明道大學 === 光電暨能源工程學系碩士班 === 99 === The purpose of our work was to develop a reflective spectrometer for thin film measurement. The multiple beam interference was produced by the reflective light of thin film top-surface and under-surface. After the reflective spectrum was obtained, we design a...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/41381874734139713153 |