Deconvolution Inspection Technology for Optical Microscopy

碩士 === 中原大學 === 機械工程研究所 === 99 === In the imaging formation of far-field optical microscopy system, for the limit of lens size and focal distance, there certainly is the loss of signal in the light diffuse from the object surface to the objective lens, this phenomenon is called as diffraction of opt...

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Bibliographic Details
Main Authors: Wun-Mao Luo, 羅文懋
Other Authors: Ming Chang
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/22428018761042526407