Investigation into time and frequency domain of EMI induced noise in op amplifier and IC circuits

碩士 === 正修科技大學 === 電子工程研究所 === 99 === In this study is two parts:the first, the electromagnetic interference(EMI) in the In-tegrated Circuit(IC) and Operational Amplifier(OP) Circuit are studied theoretically and experimentally. This experiment produces the electromagnetic field (EMF) by the form of...

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Bibliographic Details
Main Authors: Huang, Chien-Chang, 黃建璋
Other Authors: 王納富
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/20209773881407663713