Scanning Cluster of Manufacturing Shift with Spatial Structure
碩士 === 元智大學 === 工業工程與管理學系 === 98 === Statistical process control (SPC) is widely applied to monitor manufacturing processes. With the progress of production yield, Shewhart type control charts fail immediately detect small shifts, Cumulative Sum (CUSUM) and Exponentially Weighted Moving Average (EWM...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28975931886547409929 |