On the design of time-between-events control charts enhanced with runs rules for monitoring high-yield processes
博士 === 元智大學 === 工業工程與管理學系 === 98 === Shewhart control charts have been widely used to determine whether or not a process is in-control. The growing emphasis on quality of products as well as customer satisfaction has led to so-called high-yield process. In such situations, early detection of a proce...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/79609482512588875260 |