A Study of Single EWMA Controllers with Metrology Delay
碩士 === 南台科技大學 === 工業管理研究所 === 98 === Exponentially Weighted Moving Average (EWMA) controller is a popular run to run (R2R) controller. Due to its simplicity and effectiveness for process monitoring and controlling, it is widely used in semiconductor manufacturing. In practice, the problem of metrolo...
Main Authors: | Tsai Yi-Lin, 蔡依潾 |
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Other Authors: | 顏慧 |
Format: | Others |
Language: | zh-TW |
Published: |
2010
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Online Access: | http://ndltd.ncl.edu.tw/handle/85388381457365111072 |
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