Analyze the Defect Factor to Improve Process Yield of Semiconductor with ANP and Delphi Method

碩士 === 國立虎尾科技大學 === 工業工程與管理研究所 === 98 === Taiwan, as being the leader of semiconductor industry, as well as the world number one player of the market share in the foundry industry, in order to continuously maintain the advantage for its foundry industry, the production yield of chip is always the ke...

Full description

Bibliographic Details
Main Authors: Ta-Chun Chou, 周大鈞
Other Authors: 張洝源
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/r78sxg