TFT LCD Source Driver High Speed Testing Method and Test Flow Optimization
碩士 === 臺灣大學 === 電子工程學研究所 === 98 === Output diffusion testing of LCD source driver IC is very expensive and consumes very long test time due to its large amount of output pads and analog measurement requirement. A BIST structure has been proposed in to reduce the cost. The BIST scheme can relax t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/64203096234002872967 |