利用雙光軸共焦顯微術同時量測透明物質之折射係數與厚度
碩士 === 國立臺灣師範大學 === 光電科技研究所 === 98 === In this thesis Gaussian beam optical theory is applied to put forward a more accurate equation by which refractive index and thickness of transparent material can be simultaneously calculated within single scan of a novel dual-beam confocal microscope. Specimen...
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| Format: | Others |
| Language: | zh-TW |
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2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/81109240130762421958 |