Preparation of Ir covered W single atom tip
碩士 === 國立臺灣師範大學 === 物理學系 === 98 === We use the field ion microscope (FIM) to measured fluctuations of electron emission current from Ir on W single-atom tip(SAT). For electroplating Ir metals, we do not use nail polish to cover the tip. The single-atom can sometime form at the top of the nano-pyrami...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/52748250278899272404 |