應用於短距非接觸性測試系統之高整合性無線接收介面設計
碩士 === 國立清華大學 === 電機工程學系 === 98 === As much more complicated features implemented in IC (integrated circuits), the cost of IC testing is getting higher. For the general requirement, a typical SOC contains analog, digital, memory or even front-end circuits. However, to satisfy these complicated deman...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/12400333569941726846 |