Interfacial Issues in Diffusion-Barrier and Oxide Resistive Memory

博士 === 國立清華大學 === 材料科學工程學系 === 98 === The endless demand of 3C products with better and better performance has pushed great advances in electronics technologies. What we have perceived is the continuous scaling down in sizes of devices with similar or even better performance. This means not only the...

Full description

Bibliographic Details
Main Authors: Lin, Ting-Yi, 林庭誼
Other Authors: Chin, Tsung-Shune
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/02860198125451230258