Pressure influence on the rapid thermal annealing of implanted Si(111) studied by reflective second harmonic generation

碩士 === 國立嘉義大學 === 光電暨固態電子研究所 === 98 === Reflective second harmonic generation (RSHG) is a surface sensitive tool for analyzing the recrystallization phenomenon of implanted Si(111). In this work, the behavior of P dopants at varied chamber pressure would be discussed by RSHG results. In the...

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Bibliographic Details
Main Authors: Chung-Wei Liu, 劉宗維
Other Authors: Kuang-Yao Lo
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/44814823140198885938