Study on the Novel High Speed Charge Trapping Memory Devices with Poly-Si TFTs

碩士 === 國立交通大學 === 電子研究所 === 98 === In recent years, many researchers have drawn attention to improve the program/erase efficiency of charge trapping memory devices owing to the program/erase efficiency of conventional charge trapping memory devices is lower than that of floating gate memory devi...

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Bibliographic Details
Main Authors: Liu, Yen-Ting, 劉晏廷
Other Authors: 鄭晃忠
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/56237471861596607387