Low-Leakage Power-Rail ESD Protection Designs in CMOS Integrated Circuits
博士 === 國立交通大學 === 電子研究所 === 98 === Continually scaling down the CMOS technologies into nanoscale generation imposes significant challenges in integrated circuit (IC) reliability, where electrostatic discharge (ESD) protection has become one of the major concerns. To meet such reliability specificati...
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| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/52376894170912771445 |