Investigation on Board-Level and Chip-Level Charged-Device-Model ESD Issues in IC Products
碩士 === 國立交通大學 === 電機學院碩士在職專班電子與光電組 === 98 === With the continuous evolution of semiconductor integrated circuit (IC) process, the device dimension growing narrow down and developing into nanoscale. Moreover, the transistors have been fabricated with thinner gate oxides to achieve higher speed or ope...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/15371464758351379248 |