Influence of IC substrate surface finish joints with Pb-free solder in reliability test

碩士 === 國立交通大學 === 管理學院碩士在職專班工業工程與管理組 === 98 === For electronic packaging, BGA (Ball Grid Array) substrate connects to PCB (Printed Circuits Board) by using solder ball welding process, solder joints may cause cracks while the electronic components get an accidental drop. The solder joints strength d...

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Main Authors: Lin, Yen-Yi, 林延益
Other Authors: Chang, Yung-Chia
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/06915771519535249786
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spelling ndltd-TW-098NCTU50310032015-10-13T15:42:33Z http://ndltd.ncl.edu.tw/handle/06915771519535249786 Influence of IC substrate surface finish joints with Pb-free solder in reliability test IC封裝載板表面處理技術與無鉛錫球種類對焊接可靠度影響 Lin, Yen-Yi 林延益 碩士 國立交通大學 管理學院碩士在職專班工業工程與管理組 98 For electronic packaging, BGA (Ball Grid Array) substrate connects to PCB (Printed Circuits Board) by using solder ball welding process, solder joints may cause cracks while the electronic components get an accidental drop. The solder joints strength depends upon the strength of IMC (Inter-Metallic Compound) for two metal materials welding process. However, the welding strength of IMC is determined by surface finish process of basic materials and compositions of the solder ball materials. In this connection, it is very important to select a proper surface finish process of basic material and use proper solder ball to achieve the most welding strength. That will be the key consideration factors for those portable electronic products avoiding any negative impact by accidental drop by users. This study is done by DOE(Design and Analysis of Experiment) to try to find out the most proper weld compositions of the variety of Pb-free solder balls and surface finish technologies in order to achieve the best welding strength results. The factors of this DOE are Pb-free solder balls and the surface finish technologies; there are four levels for Pb-free solder balls, SAC105(Sn98.5%-Ag1%-Cu0.5%), SAC305(Sn96.5%-Ag3%-Cu0.5%), SAC405(Sn95.5%-Ag4%-Cu0.5%) and SN96.5-Ag3.5; and four levels for surface finish technologies; IT (Immersion Tin, ), ENEPIG (Electroless Nickel Electroless Palladium Immersion Gold), ENEP (Electroless Nickel Electroless Palladium) and OSP (Organic Solderability Preservatives) . The weld time is designed as an block which we may maintain the most welding strength during multi-reflow process. Therefore, it is defined to keep the experimental process by randomized complete block design for these two factors study. This experiment has demonstrated that Pb-free SAC405 collocates surface finish IT、ENEPIG or ENEP to own best welding strength after welding process of the variety of Pb-free solder balls and surface finish technologies. Chang, Yung-Chia 張永佳 2009 學位論文 ; thesis 40 zh-TW
collection NDLTD
language zh-TW
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description 碩士 === 國立交通大學 === 管理學院碩士在職專班工業工程與管理組 === 98 === For electronic packaging, BGA (Ball Grid Array) substrate connects to PCB (Printed Circuits Board) by using solder ball welding process, solder joints may cause cracks while the electronic components get an accidental drop. The solder joints strength depends upon the strength of IMC (Inter-Metallic Compound) for two metal materials welding process. However, the welding strength of IMC is determined by surface finish process of basic materials and compositions of the solder ball materials. In this connection, it is very important to select a proper surface finish process of basic material and use proper solder ball to achieve the most welding strength. That will be the key consideration factors for those portable electronic products avoiding any negative impact by accidental drop by users. This study is done by DOE(Design and Analysis of Experiment) to try to find out the most proper weld compositions of the variety of Pb-free solder balls and surface finish technologies in order to achieve the best welding strength results. The factors of this DOE are Pb-free solder balls and the surface finish technologies; there are four levels for Pb-free solder balls, SAC105(Sn98.5%-Ag1%-Cu0.5%), SAC305(Sn96.5%-Ag3%-Cu0.5%), SAC405(Sn95.5%-Ag4%-Cu0.5%) and SN96.5-Ag3.5; and four levels for surface finish technologies; IT (Immersion Tin, ), ENEPIG (Electroless Nickel Electroless Palladium Immersion Gold), ENEP (Electroless Nickel Electroless Palladium) and OSP (Organic Solderability Preservatives) . The weld time is designed as an block which we may maintain the most welding strength during multi-reflow process. Therefore, it is defined to keep the experimental process by randomized complete block design for these two factors study. This experiment has demonstrated that Pb-free SAC405 collocates surface finish IT、ENEPIG or ENEP to own best welding strength after welding process of the variety of Pb-free solder balls and surface finish technologies.
author2 Chang, Yung-Chia
author_facet Chang, Yung-Chia
Lin, Yen-Yi
林延益
author Lin, Yen-Yi
林延益
spellingShingle Lin, Yen-Yi
林延益
Influence of IC substrate surface finish joints with Pb-free solder in reliability test
author_sort Lin, Yen-Yi
title Influence of IC substrate surface finish joints with Pb-free solder in reliability test
title_short Influence of IC substrate surface finish joints with Pb-free solder in reliability test
title_full Influence of IC substrate surface finish joints with Pb-free solder in reliability test
title_fullStr Influence of IC substrate surface finish joints with Pb-free solder in reliability test
title_full_unstemmed Influence of IC substrate surface finish joints with Pb-free solder in reliability test
title_sort influence of ic substrate surface finish joints with pb-free solder in reliability test
publishDate 2009
url http://ndltd.ncl.edu.tw/handle/06915771519535249786
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