Development of New Formula for Filling Through-Hole by Copper Electroplating

碩士 === 國立中興大學 === 化學工程學系所 === 98 === The size of electronic products is requested to be smaller and smaller. They provide several advantages such as reduced packaging area, light weight, higher interconnection density, high reliability, and excellent electrical performance with lower resistance....

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Bibliographic Details
Main Authors: Chun-Wei Lu, 盧俊瑋
Other Authors: Wei-Ping Dow
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/03989723978302179665