Study of Delamination for Die Attach Process in IC Assembly
碩士 === 明新科技大學 === 精密機電工程研究所 === 99 === The application of Die Attach Film (DAF) has greatly improved the quality for IC assembly. It is also a cost effective technology getting more and more interesting in industry. Warpage, delamination and cracking are problems common found during IC assembly....
Main Authors: | Su Chan Chih, 蘇展志 |
---|---|
Other Authors: | 王進安 |
Format: | Others |
Language: | zh-TW |
Published: |
2010
|
Online Access: | http://ndltd.ncl.edu.tw/handle/69531591899062063764 |
Similar Items
-
Study of crack and delaminating in IC assemble process
by: 張傳忠
Published: (2008) -
Applying TRIZ theory to solve delamination issue in IC assembly
by: Chang-Chih Wang, et al.
Published: (2019) -
The FEM analysis and verification of reliability in assembly engineer of automobile IC–Case study of MCP delamination
by: Hung, Ying-Hao, et al.
Published: (2010) -
Study on Delamination Between Polymer Materials and Metals in IC Packaging Process
by: Cheng-Tang Pan, et al.
Published: (2019-05-01) -
Thermal compression process for power IC Attachment and the joint properties
by: Chih-Hao Fan, et al.
Published: (2015)