Study of Delamination for Die Attach Process in IC Assembly

碩士 === 明新科技大學 === 精密機電工程研究所 === 99 === The application of Die Attach Film (DAF) has greatly improved the quality for IC assembly. It is also a cost effective technology getting more and more interesting in industry. Warpage, delamination and cracking are problems common found during IC assembly....

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Bibliographic Details
Main Authors: Su Chan Chih, 蘇展志
Other Authors: 王進安
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/69531591899062063764

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