Refractive Index and Thickness of Thin Films Measured by White Light Interferometry
碩士 === 明新科技大學 === 電子工程研究所 === 99 === A white-light vertical scanning Michelson interferometer has been successfully built to measure refractive index and thickness of optical thin films in the study. The white-light interferometer is based on short white-light coherence length and measure optical pa...
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| Format: | Others |
| Language: | zh-TW |
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2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30244495543722605760 |