Reliability Evaluation through Accelerated Life Testing - A Case Study on LCD Source Driver IC

• Main Author: 林自立
• Other Authors: 黃嘉若
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/54299370386083024126

碩士 === 明新科技大學 === 工業工程與管理研究所 === 99 === Study conducted in this thesis is aimed at obtaining an optimum approach for planning and designing accelerated reliability test for reliability evaluation in preproduction and mass production process. Core articles considered in this test planning and design operation are settle of test profile, settle of accelerating and reliability evaluation model , failure criteria set up, activation energy estimation, selection of test method and designing of function test. When the planning and designing concept was applied to the case of accelerated reliability test in LCD Source Driver IC preproduction process, a test profile with two accelerating stress and 1,000 test hours was constructed, Arrhenius-Inverse law combined accelerate factor formula was chosen, the quantity of activation energy was decided through comparison and calculation, functional test method was settled according to the function requirements of the driver IC, reliability test and evaluation process was chosen by analysis and comparing the suitability of three established test plan, failure criteria of the test was established by following MIL-STD-781C regulation. All the results of the analysis and comparison stated above were then composed into the case study test plan. After running the test plan, the result of such an application was checked and reviewed, and meaningful finds are used for adjusting and correcting of the initial planning and designing so as to yield an optimum test approach.