Reliability Evaluation through Accelerated Life Testing - A Case Study on LCD Source Driver IC
碩士 === 明新科技大學 === 工業工程與管理研究所 === 99 === Study conducted in this thesis is aimed at obtaining an optimum approach for planning and designing accelerated reliability test for reliability evaluation in preproduction and mass production process. Core articles considered in this test planning and design...
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| Format: | Others |
| Language: | zh-TW |
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2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54299370386083024126 |