Improvements of the Efficiency for Semiconductor Testing program

碩士 === 義守大學 === 電子工程學系碩士班 === 98 === This paper presents how to utilize software to improve the order of movements for hardware of the tester and reach the best efficiency. The proposed method is verified by using the real sample IC and the tester with the test programs. The testing programs are reg...

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Bibliographic Details
Main Authors: Tsung-Hsien Lin, 林宗憲
Other Authors: none
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/15472458867031059144