A Study of the Process Capability Assessment for Yield Index Spk based on Bayesian Approach
碩士 === 逢甲大學 === 應用數學所 === 98 === Process capability indices are closely related to yield, among them, only Cp index and Spk index have one to one correspondence with the yield. Cp index could be only applied when the process mean equals to the specification center. Spk index does not have such limit...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/23383606067022791425 |