Practice and Verification of Flash Memory Testing Algorithm Based on ATE
碩士 === 逢甲大學 === 資訊電機工程碩士在職專班 === 98 === The Flash memory, due to the high-capacity and low price, has become increasingly popular in the consumer market. With mass production in the existing market, how can we quickly and correctly detect the Flash memory cell failures. In the industry, development...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/54685288534481274862 |