Design and Simulation of Schottky Barrier Flash Memory

碩士 === 元智大學 === 電機工程學系 === 97 === The standard floating gate Flash cells is the mainstream nonvolatile semiconductor memory. The challenges to future scaling are imposed by the non-scalable tunneling oxide and high voltage to provide sufficient drain-side hot electron injections. This study uses two...

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Bibliographic Details
Main Authors: Yan-Xiang Luo, 羅彥翔
Other Authors: 施君興
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/97333038717092396795