The Study of Relationship Between Entry Mode and Knowledge Transfer In Electromagnetic Interference Test Industry

碩士 === 大同大學 === 事業經營學系(所) === 97 === The continuous and fast updating of the high technology electronic products makes products’ life cycle become considerably short. People enjoy the convenience brought by the technology; meanwhile they are afraid of the harm of the electromagnetic wave from the te...

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Bibliographic Details
Main Authors: An-Feng Tsai, 蔡安奉
Other Authors: Yung-Kuei Liang
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/54103486602619010675