X-Filling Methodology for Power-Aware At-Speed Scan Testing
碩士 === 淡江大學 === 電機工程學系碩士班 === 97 === ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents an X-filling approach called Adjacent Backtracing fill (AB-fill). Adjacent Backtracing fill, in which both the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/46630519415611587303 |