Development of a 0.18μm , 60V ,Power Device based on SOI LDMOS Technology

碩士 === 亞洲大學 === 資訊工程學系碩士班 === 97 === The high junction leakages, circuit latched issues, and high parasite capacitances happened in the device manufactured by junction isolation technology can be eliminated or improved if the device is manufactured by the thin SOI (Silicon-On-Insulator) technology....

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Bibliographic Details
Main Authors: Yu Shan Hsu, 許瑜珊
Other Authors: Shao Ming Yang
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/93344457966985952595