A Field-Programmable Gate Array based High Accuracy Vernier Digital-to-Time Converter
碩士 === 國立臺灣科技大學 === 電子工程系 === 97 === Nowadays, automatic test equipments (ATE) are widely adopted in the industry to increase the fabrication efficiency. Compared with manually or semi-automatic testing equipments, ATE provides not only fast defect detection, higher operation speed but also less hum...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/01976172533076486427 |