Process Monitoring for LCD Defect Inspectionwith Line-Scan Cameras
碩士 === 國立臺灣大學 === 資訊網路與多媒體研究所 === 97 === In this thesis, we develop a process monitoring algorithm to detect whether the processes running on the LCD defect inspection system fail or are unusually busy and thereafter correct them. We aim to implement this method on the LCD (Liquid Crystal Display) d...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/58426398812513587312 |