Investigation of InGaN/GaN Nanostructures Using the X-ray Diffraction Techniques
博士 === 國立臺灣大學 === 電機工程學研究所 === 97 === In this dissertation, we utilize X-ray diffraction technique to characterize InGaN/GaN nanostructures. First, we compare the X-ray diffraction (XRD) results of two InGaN/GaN quantum-well (QW) structures to observe the effects of prestrained growth by depositing...
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| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14876168876168539602 |