Research on the Testability of Quantum Boolean Circuits
博士 === 國立臺灣大學 === 電機工程學研究所 === 97 === Circuit testing is now over 45 years and poses many considerable challenges. The circuits of modern electrical appliances become more and more complicated and the cost of circuit testing is rapidly increasing along with the complexity of the chip. According to I...
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| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/09789931876530670157 |