Study of the Optical Spectra Affected by the Distribution of the Ge Dots within the MOS Structure

碩士 === 國立臺灣大學 === 電子工程學研究所 === 97 === In the thesis the optical spectra affected by the distribution of the Ge dots within the MOS structure are reported. There are mainly two series of experiments in this thesis. First, the multi-layer Ge dots within the MOS structure are manufactured by E-gun evap...

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Bibliographic Details
Main Authors: Nai-Yun Hsu, 許乃允
Other Authors: 管傑雄
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/13198281247195440282