Modern VLSI Routing Considering Reliability and Manufacturability

博士 === 國立臺灣大學 === 電子工程學研究所 === 97 === As nanometer technologies of very-large-scale integration (VLSI) advances, design complexity grows at a dramatic speed. Nowadays, a chip may contain several billion transistors and has over one million nets. In the nanometer era, routing has become a decisive fa...

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Bibliographic Details
Main Authors: Huang-Yu Chen, 陳皇宇
Other Authors: Yao-Wen Chang
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/49728744212730864025