Study on Effects of Process Paramenters to Crystallinity and Doping Characteristics of Silicon Thin Film Deposited by High Density Plasma Chemical Vapor Deposition (HDPCVD)

碩士 === 國立清華大學 === 電子工程研究所 === 97 === In this research work, we use high density plasma chemical vapor deposition system to fabricate uc-Si/poly-Si films, and study the crystallinity and doping characteristics affected by adjustable process parameters, hydrogen dilution ratio, RF power, process press...

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Bibliographic Details
Main Authors: Chan, Feng-Ming, 詹豐銘
Other Authors: Hwang, Huey-Liang
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/89653949963544088676