Study of Tunnel Oxide and Inter-poly Dielectric with WSix Gate for Application in Nano-scale NAND Flash Memory Technology

博士 === 國立清華大學 === 電子工程研究所 === 97 === The objective of this dissertation is to investigate the feasibility of continued scaling for nanoscale floating gate NAND flash memory by means of integration optimization and novel process application. The analysis of anomalous tunnel oxide re-growth has been c...

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Bibliographic Details
Main Authors: Ching Yuan Ho, 何青原
Other Authors: ChenHsin Lien
Format: Others
Language:en_US
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/11079680279743839275