使用非冗餘的移除及添加技術來減少軟錯誤率的研究

碩士 === 國立清華大學 === 資訊工程學系 === 97 === With the advances of semiconductor technology, the transistor size has been scaled down. This shrinkage makes the circuits more susceptible to the soft error, which is a wrong signal or data latched by storage elements. Thus, Soft Error Rate (SER) reduction has be...

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Bibliographic Details
Main Authors: Lin, Chia-Chi, 林佳奇
Other Authors: Wang, Chun-Yao
Format: Others
Language:en_US
Online Access:http://ndltd.ncl.edu.tw/handle/96281023575734181642