Research on Critical Factors of Unnatural Control Chart Patterns- A Case Study of Lithography Process in LTPS TFT LCD

碩士 === 國立清華大學 === 工業工程與工程管理學系工程碩士在職專班 === 97 === Control chart has been widely implemented in manufacturing for quality management, and its purpose is to monitor the product quality during the manufacturing process. However, caused by key-factors’ variation, Control-chart, collected from actual prod...

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Bibliographic Details
Main Author: 黃正義
Other Authors: 蘇朝墩
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/21237418225608325303