| Summary: | 碩士 === 國立中山大學 === 電機工程學系研究所 === 97 === This thesis focuses on the analysis theory, circuit design, simulations, and chip measurements of the transfer stage in the continuously error-trimming comparator-based switched-capacitor charge transfer stage in the cyclic redundant-sign-digit (RSD) algorithm.
Capacitor mismatching remains an insurmountable factor for switched-capacitor circuit designers. To correct errors which result from the capacitor mismatching, a continuous error-trimming circuit is generalized from a typical CBSC circuit. The
analysis theory of the error-trimming operation describes the effects of the error-trimming circuit in the CBSC circuit, as well as the guidelines for trimming. The error-trimming operation is able to tune the gain and virtual condition of the charge transfer stage for canceling the gain and offset errors. The circuit is designed, with the 0.35μm 2-poly 4-metal TSMC process, in fully integral circuits. The circuit is
simulated by a matlab simulator and an online Cadence Spectre simulator, to confirm how the operation works. Finally, chip measurements are recorded for verification and simulation comparisons.
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