Investigate Short-Channel Effects and Thermal Behavior of a Novel Pseudo Tri-Gate Vertical Ultrathin MOSFETs with Source/Drain Tie

碩士 === 國立中山大學 === 電機工程學系研究所 === 97 === This paper investigates the device behavior of a novel pseudo tri-gate ultrathin channel vertical MOSFET with source/drain tie (S/D tie), the PTG-SDT VMOS. The S/D tie (SDT) of this novel device circumvents short channel effect (SCEs). A double- surround-gate (...

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Bibliographic Details
Main Authors: Ying-chieh Tsai, 蔡英杰
Other Authors: Jyi-Tsong Lin
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/4542qm