Electrical Analysis and Carrier Transport Characterization of Silicon Nanowire Transistors

碩士 === 國立中央大學 === 電機工程研究所 === 97 === In the past decades, the device dimensions have being aggressively scaled into the nanometer regime, in which strong quantum mechanics effects emerge to affect carrier transport. Consequently, the classical drift-diffusion models are not enough to explain well th...

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Bibliographic Details
Main Authors: Cheng-Chih Lin, 林政智
Other Authors: Pei-Wen Li
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/33349640965836265205