Built-in Jitter Measurement Circuits Designs and Applications in Serial-Link Transceivers
博士 === 國立中央大學 === 電機工程研究所 === 97 === The need for high timing resolution markedly increases test cost and limits feasible designs. To overcome these limitations, the built-in jitter measurement (BIJM) circuit is generally used to measure on-chip signal jitter distribution. Generally, the timing meas...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/68178699500639964898 |