The XPS Analysis of GaN by N2+ Ion Beam Nitridation GaAs

碩士 === 國立中央大學 === 材料科學與工程研究所 === 97 === Abstract   Because of its good physical properties, GaN becomes an important m- aterial that is widely used on various dimensions. Nowadays, many techniq- ues are taken to produce GaN, such as MOCVD, MBE, etc. However, due to there are large lattice mismatch b...

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Bibliographic Details
Main Authors: Ron-Kai Hsu, 許榮凱
Other Authors: Biing-Hwa Yan
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/mbjnjc