Fabrication and characterization of Si nanocrystals thin films

碩士 === 國立交通大學 === 顯示科技研究所 === 97 === In this thesis, SRO (silicon rich oxide)/SiO2 multilayer structure was first grown by magnetron sputtering, and then, Si NCs precipitated through high temperature annealing process. By using Fourier transform infrared spectroscopy (FTIR), we identify the formatio...

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Bibliographic Details
Main Authors: Lin, Yi-Shian, 林怡先
Other Authors: Lee, Po-Tsung
Format: Others
Language:en_US
Online Access:http://ndltd.ncl.edu.tw/handle/71085727980602191038