Nano-Measurement Using Laser Diffractometer and Traceable Atomic Force Microscope
碩士 === 國立交通大學 === 機械工程系所 === 97 === A laser diffractometer can calibrate grating pitch, 2D grating angle, and measure the refractive index of liquids. The measurement principle is based on the Littrow configuration, in which a reflective diffraction beam coincides with an incident beam. The pitch va...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/17610951458582715024 |