Scanning Near-field Optical Microscopy of Semiconductor Micro and Nano Structures
碩士 === 國立交通大學 === 電子物理系所 === 97 === Scanning Near-field optical microscopy (SNOM) with high resolution was used to study optical properties in microdisks, photonic crystals, InN and InGaN dots. Finite difference time domain (FDTD) simulation confirm the experimental results. Near-field image show th...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56505446126840975622 |