System-Level ESD Protection Design in CMOS ICs With Transient Detection Circuits
博士 === 國立交通大學 === 電子工程系所 === 97 === System-level electrostatic discharge (ESD) events have become a primary reliability issue in CMOS integrated circuit (IC) products. With more and more complicated design of integrated circuits, such as mixed-signal, mixed-voltage, system-on-chip (SOC), etc, CMOS d...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07857458140945747413 |