A Study of Phase-change Kinetics of AgInSbTe and Its Nanocomposite Thin Films by In-situ Electrical Property Measurement
碩士 === 國立交通大學 === 材料科學與工程系所 === 97 === In this study, a self-assembly in-situ electrical property measurement system was adopted to study the phase-change kinetics of AgInSbTe (AIST) and AIST-SiO2 nanocomposite thin films. X-Ray diffraction (XRD) showed that the as-deposited amorphous AIST transform...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2009
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96017506928526942097 |